从静态限值转移到动态零部件平均测试 (PAT) 限值
案例研究
The current web page context is a case study of how PathWave Manufacturing Analytics (PMA), a Keysight product, helped a high-volume automotive microcontroller manufacturer improve equipment efficiencies and reduce scrap by implementing dynamic Part Average Test (PAT) limits instead of static PAT limits. PMA is a solution that processes and analyzes production line data and provides near real-time feedback to optimize device testing processes. The case study shows how PMA helped reduce false rejects by more than 2%, improve overall equipment efficiency by more than 2%, and maintain device quality. The case study also provides a general description of the original static production test flow and the new dynamic final production test flow, as well as a figure comparing static limits and dynamic PAT limits. For more information on PMA, visit www.keysight.com/find/pathwaveanalytics. For more information on Keysight products, applications, or services, visit www.keysight.com.
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