Accelerating NPI Development with Pathwave Manufacturing Analytics (PMA)
应用文章
This application note introduces the PathWave Manufacturing Analytics (PMA) innovative NPI Mode feature, streamlining the New Product Introduction (NPI) debug phase by offering real-time data collection and advanced analytics capabilities. This feature allows engineers to perform on-demand calculations of the Capability Process Index (CPK) and Part Average Testing (PAT) for quick insights into test stability and product quality improvement. Users can easily navigate the intuitive dashboard to select parameters and instantly generate CPK and PAT results. The note underscores the benefits of on-demand CPK analysis, including efficiently sorting test results and visualizing measurement trends. Furthermore, it discusses the significance of PAT6 limit recommendations in optimizing test limits and enhancing measurement data analysis. In conclusion, the NPI Mode in PMA empowers engineers to expedite the NPI debug phase, enhancing productivity and improving time-to-market, cost savings, and customer satisfaction.
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