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The Keysight B1500A Semiconductor Device Analyzer with EasyEXPERT software comes with more than 100 categorized application tests, which greatly reduce the time required for characterizing new devices, processes and materials.
The application tests provided in the EasyEXPERT software library are conveniently categorized by device type and application. Sample categories include bipolar junction transistors (BJT), complementary metal-oxidesemiconductor (CMOS) transistors, nanotechnology structures and reliability tests. Although these application tests are ready to use as supplied, in some cases it may be necessary to customize them in order to meet the unique testing requirements of specialized technologies and devices.
Most of the input parameters for the EasyEXPERT application tests have upper and lower test limits. These limits are in-place to protect devices from damage that could occur from inadvertent mistakes such as incorrect keystrokes or operator entry error. However, it is a relatively simple process for users to modify the input parameter ranges of the supplied EasyEXPERT application tests.
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