Column Control DTX

Vectorless Test: nanoVTEP vs VTEP

应用文章

In the early 2000s, ball grid array and accessible Surface Mount Technologies (SMT) components were the standard on most printed circuit board assemblies (PCBAs). At that time, Keysight’s Vectorless Test Enhanced Probe (VTEP) was a real breakthrough for increasing coverage for in-circuit test. But nowadays, the integrated circuits (ICs) and accessible surface mount device (SMD) components are getting smaller such that they could be mounted onto PCBAs. This causes the spaces to condense; and the fixture density increases which limit the sensor plate and amplifier placement.

×

请销售人员联系我。

*Indicates required field

您希望以何种方式进行联系? *必填项
Preferred method of communication? 更改电子邮件地址?
Preferred method of communication?

请通过单击按钮,提供给是德科技您的个人数据。请在Keysight隐私声明 中,参阅有关我们如何使用此数据的信息,謝謝。

感谢您!

A sales representative will contact you soon.

Column Control DTX