Boundary Scan Test Development on i1000D In-Circuit Test System
应用文章
Boundary Scan test technology (IEEE 1149) is now commonly used in the electronic test industry today.
In this document, will talk about what test engineers should prepare to ensure good boundary scan implementation in order to reduce your engineering effort. The suggestions below are based on implementing boundary scan test on many different PCBAs of different functions over different i1000 In-Circuit Test (ICT) systems in different manufacturing sites across the world.
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