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The W7021E PathWave IC-CAP PSP Model Extraction Package provides measurement and extraction procedures for PSP, a CMC industry-standard model advanced surface potential model for MOSFET devices.

Highlights

The W7021E PathWave IC-CAP PSP Model Extraction Package includes:

  • DC, CV, and RF extraction for the latest PSP version, including  high-frequency effects
  • Robust, direct extraction procedures find the best initial values for optimizers, thereby removing the need for excessive optimization and tuning steps
  • Flexible, customizable extraction flow
  • Windows-style data visualization, optimization, and tuning
  • Shared user interface environment with other extraction CMOS extraction products
  • Target and Corner Modeling

PSP, a CMC industry-standard advanced surface potential model, was jointly developed by Arizona State University and NXP Semiconductors. The PSP model calculates the device’s surface potential, enabling a more accurate description of the deep sub-micron physical phenomena and, in turn, of the internal currents and charges.

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