这是您想要的页面.
查看搜索结果:
Choose a country or area to see content specific to your location
- Home
- 产品与服务 - 电子测试仪器
- ...
- 设计与测试软件
- EDA 软件
- W7023E PathWave IC-CAP BSIMSOI Model Extraction Package
您希望搜索哪方面的内容?
建议的搜索
No product matches found - System Exception
符合的结果
The W7023E PathWave IC-CAP BSIMSOI Model Extraction Package provides measurement and extraction procedures for BSIMSOI industry-standard model for Silicon-On-Substrate (SOI) MOSFET devices.
Highlights
The W7023E PathWave IC-CAP BSIMSOI Model Extraction Package includes:
- DC, CV, and RF extraction for BSIMSOI v4.6.1, including high-frequency effects
- Robust, direct extraction procedures find the best initial values for optimizers, thereby removing the need for excessive optimization and tuning steps
- Flexible, customizable extraction flow
- Windows-style data visualization, optimization and tuning
- Shared user interface environment with other extraction CMOS extraction products
- Target and Corner Modeling
- Binning model support
BSIMSOI, an industry-standard model based on the BSIM3 model for bulk devices. It shares the same basic equations with BSIM3 so that the physical nature and smoothness of BSIM3v3 are retained. BSIM-SOI was selected by Si2 Compact Model Coalition (CMC) as the standard SOI MOSFET model in December 2001.
需要帮助或遇到问题?