应用文章
Industry-wide, power rail characterization, validation, and debugging are critical for electronic device test. They help engineers optimize circuit design to withstand peak and in-rush currents, optimize power management, decrease power consumption, and guard against malicious security intrusions.
As device operating cycles grow longer and the need to conserve power increases, designers require a solution to log power rail current and voltage for long intervals at high sampling rates to ensure device reliability.
However, there are no existing solutions to perform long duration measurement at a high sampling rate with enough sensitivity. Therefore, designers may miss unexpected or abnormal operation due to the slow sampling rate measurement, lack of memory depth, or lack of sensitivity. In addition, the analysis of long duration measurement is another challenge. Since the data file is massive, it takes a long time to analyze in detail.
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