Method of Implementation (MOI) for USB4 Transmitter & Receiver Return Loss

Keysight Technologies offers a comprehensive solution for USB4 transmitter and receiver return loss testing using its vector network analyzers (VNAs) with enhanced time-domain analysis (TDR) software. The solution supports both USB4 version 1.0 and 2.0 specifications, and covers different test fixtures and test controllers from Wilder Technologies. The solution also integrates with the USB4 Electrical Test Tool (ETT) and SigTest tool from USB-IF to automate the test setup and data analysis. The Keysight VNAs that can be used for USB4 return loss testing include: - E5080B ENA Series VNA: 4-port test set, 9 kHz to 20 GHz - P5024A Streamline USB Series VNA: 4-port test set, 9 kHz to 20 GHz - M9804A PXI Multiport VNA: 4-port test set, 300 kHz to 20 GHz - N522xB PNA Series VNA: 4-port test set, 10 MHz to 20 GHz The Keysight S9x011A/B enhanced time-domain analysis with TDR software is recommended for gating setup when using the legacy SMP test fixture. The software can also perform ECal calibration for both frequency-domain and time-domain measurements. The Wilder Technologies test fixtures that can be used for USB4 return loss testing include: - Wilder TBT3/Type-C fixture (SMA): No gating setup or fixture de-embedding is needed. Supports USB4v1 and USB4v2 testing. - Wilder TBT3/Type-C fixture (Legacy 2.92mm SMP): Gating setup is required to remove the 100-Ohm impedance from 2.92mm SMP. Supports USB4v1 testing only. The Wilder Technologies test controllers that can be used for USB4 return loss testing include: - USB4-TPA-UC (USB4 microcontroller) - CG3-TPA-TR (Thunderbolt microcontroller) The test procedure for USB4 return loss testing consists of the following steps: - Recalling a state file or manual setup for measurement conditions - Setting up test equipment and test fixture connections based on test setup diagrams - Performing ECal calibration for frequency-domain and time-domain measurements - Running USB4ETT from the connected PC to control the DUT transmitter/receiver to output the required patterns - Performing frequency domain measurements to save S-parameter touchstone file (S2P) for SigTest tool analysis - Running SigTest to verify differential return loss (Sdd22), common-mode return loss (Scc22), and integrated return loss (IRL) pass/fail results For more information on Keysight Technologies’ products, applications, or services, please visit: www.keysight.com