应用文章
The atomic force microscope (AFM) has become a powerful tool for investigating surfaces on an atomic or nanometer scale. An AFM consists of a sharp cantilevered tip that is raster-scanned with sub-nanometer precision over a surface. The interaction forces between the tip and sample cause a minute cantilever deflection, which is sensed by optical deflection to produce a topographical map of the surface on the nanometer or atomic scale.
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