应用文章
In this application note, we describe electromagnetic (EM) simulations using the Keysight Technologies, Inc. EMPro software1 to support the interpretation of scanning microwave microscope (SMM) experiments. The SMM is a new scanning probe microscope that combines the electromagnetic measurement capabilities of a microwave Performance Network Analyzer (PNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an atomic force microscope (AFM).
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