应用文章
Atomic force microscopy (AFM) is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution. AFM is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer blends.
Instrumentation
The Keysight Technologies, Inc. 7500 AFM/SPM microscope is a high-performance instrument that delivers high resolution imaging with integrated environmental control functions. The standard Keysight 7500 includes contact mode, acoustic AC mode, and phase imaging that comes with one universal scanner operating in both Open-loop and Closed-loop mode. Keysight’s patented magnetic AC mode (MAC® Mode) is offered as a system option. Switching imaging modes with the Keysight 7500 AFM/SPM microscope is quick and convenient, a result from the scanner’s interchangeable, easy-to-load nose cones.
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