应用文章
The development of the atomic force microscope (AFM) has allowed scientists and engineers to observe the details of molecular structures with unprecedented resolution and without the need for rigorous sample preparation or labeling. In addition to topographical imaging, AFM can sense nanomechanical and other fundamental properties of sample surfaces, including local adhesion and elasticity. Microscopic adhesion affects a variety of events from the behavior of ceramics and semiconductors to DNA replication and drug binding in the human body. The AFM offers a tool to study these important parameters on the nanometer scale using a technique that detects forces on the AFM probe tip as it approaches and retracts from a surface.
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