“All in One” Solution for LF-Noise Measurement with the Keysight M9601A
应用文章
Improving LF Noise Measurements
The Keysight E4727B (Advanced Low-Frequency Noise Analyzer; A-LFNA) easily allows measurement of semiconductor device LF (Low Frequency) noise. The E4727B platform is extensible via PXIe cards, which can improve LF noise measurements and reduce system costs. Instead of supplying bias voltages using an external DC Source/Monitor such as in the Keysight B1500A, the Keysight M9601A (PXIe Precision Source/Monitor Unit) installs directly in the E4727B, providing an “All in One” solution for LF noise measurement. This Application Note explains the benefits of using M9601As in the E4727B.
Benefits of Using M9601As in E4727B
The Keysight M9601A is a precision source/measurement unit (SMU) with the capability to source voltage and current while taking direct measurements. It supplies voltages from 500 nV to 210 V and currents from 10 fA to 315 mA. These ranges match the voltage and current supply needs of the E4727B specification, listed as 200 V/100 mA. Compared with using an external source, installing the M9601A in an E4727B delivers these benefits:
- Lower system noise
- Compact, single-point grounding
- Lower system costs