How to Create Robust Designs with High Yields

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A successful design is not one that just meets the specifications.  When manufactured, especially in big quantities, variation in the components and variation in the manufacturing process parameters around their nominal values result in final products, most of which do not meet these design specifications.  Therefore, having powerful statistical design tools is crucial to ensure robustness and high manufacturing yield.

 

This presentation illustrates unique design methodologies that help designers produce robust designs with first pass and high yield.  This methology eliminates design iterations, saves an enormous amount of time and money, and enables companies to be first to market and gain a competitive edge. 

 

Learn: 

• Design of Experiments (DOE)

• Yield and Yield Sensitivity Historgrams (YSH)

• Techniques to include both circuit and EM effects using ADS and RFPro.