Remote Controlling E4727B for Automated LF Noise Measurements
应用文章
In integrated circuit design, Low-Frequency (LF) noise can have a profound impact on circuit performance, affecting signal integrity, inducing timing jitter, and degrading linearity. The Keysight E4727B (Advanced Low-Frequency Noise Analyzer; A-LFNA) shown in Figure 1 allows measurement of semiconductor devices’ LF noise using customized hardware and software running on Keysight Device Modeling WaferPro. This turnkey solution enables users to control a probe station, external instruments, and a thermal controller, allowing for fully automated noise measurements across lots, wafers, dies, subsites, and devices using a test plan. Test automation through WaferPro and A-LFNA enables high-throughput noise testing for production or large-scale device characterization, thereby reducing instrument idle times, eliminating human errors in test setup, and ensuring consistent measurement results under dynamic operating conditions. In this application note, we measure LF noise on several NMOS devices remotely with different measurement groups using A-LFNA remote control and carry out data post-processing on a local computer.