应用文章
Recently, vector network analyzer (VNA) based time domain reflection/time domain transmission (TDR/TDT) measurements have become very popular because of their higher accuracy and ESD robustness. Accordingly, the requirement for understanding the measurement uncertainty associated with VNA-based TDR/TDT measurements has become more critical. Although S-parameter measurement uncertainty has been studied for many years, VNA-based TDR/TDT measurement uncertainty has not been characterized as thoroughly. It is the intent of this paper to propose a robust method to calculate measurement uncertainty of VNA based TDR/TDT measurement on the basis of not only systematic instrumentation error, but also based on both time and frequency domain dependent information. As a design case study for a real world example, Keysight Technologies, Inc. ENA series network analyzer with option TDR will be discussed in detail.
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