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Switches and switch matrices are widely used for the routing of RF and microwave signals in high-speed ATE systems. As today’s devices and products become more complex, there is an increasing need for the speed and flexibility of switching systems capable of connecting multiple signals or instruments to multiple devices under test (DUTs).
On a smaller scale, the same is true in R&D and design validation when developing such products or when creating test routines that will be used later in manufacturing. Even on the bench or in a small system, dependable switching can improve efficiency and save time.
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