Pulsed Measurement of IV Characteristics and S-Parameters

Pulsed Measurement of IV Characteristics and S-Parameters

Model your devices across their linear and non-linear regions with pulsed measurements
 

Current-voltage characteristics (IV characteristics) and scattering parameters (S-parameters) are critical in understanding the performance of any active device. Pulsed measurements of IV characteristics and S-parameters can eliminate heating and trapping effects allowing device modeling to be undertaken under quasi-isothermal operating conditions in both their linear and non-linear operating regions.

Maury Microwave provides proven technology for pulsed measurements of IV characteristics and S-parameters. For pulsed measurements of S-parameters the technology is used in conjunction with the Keysight Technologies PNA-X microwave network analyzer. A complete solution comprises a Maury pulse controller that includes DC power supplies, external gate and drain pulse heads, Maury’s IVCAD software and a Keysight PNA-X for the RF measurements.

With a pulsed IV and S-parameters measurement system from Maury and Keysight you can characterize and model your devices across their entire linear and nonlinear operating range providing a better understanding of your device technology and more accurate simulations for your product development.

• Pulsed measurement of IV characteristics and S-parameters
• Pulsed measurements can eliminate heating and trapping effects
• Allows active device modelling under quasi-isothermal conditions
• Model your devices across their linear and non-linear operating regions
• Uses Keysight PNA-X for pulsed measurement of S-parameters
• Pulsed measurements provide more accurate simulation of your active devices

To learn how this solution can address your specific needs please contact Keysight’s solution partner, Maury Microwave