Simultaneous all-optical measurement of loss (IL) / return loss (RL), polarization dependent loss (PDL), group delay (GD) and different group delay (DGD)
Application-Programmable Interface (API) for custom analysis, remote control and automation, and integration with simulation software solutions
All measurements made in swept-wavelength mode for shortest test time at picometer wavelength resolution
Software-enabled multi-port testing and new noise threshold feature for more convenient analysis of multichannel devices
