您希望搜索哪方面的内容？
K8215A Advanced Throughput Multiplier Feature, GTE 10.00p
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
HIGHLIGHTS
The i3070 In-Circuit Test System architecture is split into 4 modules. Each module can execute tests in parallel with the rest, so you can test 4 printed circuit boards at one time.
For cases when you need to test homogeneous (identical) boards with more than 1000 nodes each, you can combine 2 modules together using the Advanced Throughput Multiplier feature. This allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
扩展您产品的功能
需要帮助或遇到问题？