In-Circuit Testplans

Developing a robust In‑Circuit Test (ICT) application is a complex task that requires combining multiple measurement sciences, production‑ready programming practices, and reliable automation control. This application note provides a comprehensive overview of how in‑circuit testplans are structured and executed on the Keysight i3070 system, serving as a foundation for test engineers seeking to build high‑quality, maintainable ICT applications.

The document begins by defining the purpose of the testplan as the central executive that controls test sequencing, fixture operation, operator interaction, data logging, and safe error handling. It explains the high‑level flow of a typical testplan, including initialization routines, continuous test loops, test section execution, and interrupt handling required to safely power down boards and manage runtime or operator‑initiated stops. The role of the In‑Circuit Program Generator (IPG) is described, showing how it automatically generates a largely complete testplan using board definition files and standardized testmain templates, while still allowing controlled customization for production needs.

Panelized board testing is explored in detail, highlighting how board enablement and pass/fail tracking are managed through dedicated variables to ensure that all tests within a section are completed correctly, even when individual boards fail early. The application note also addresses the additional requirements introduced by in‑line and automated manufacturing environments. These include PLC communication, barcode handling, dual‑stage probing, and configurable test sequencing using Short_Travel and Long_Travel test arrays.

By explaining both offline and in‑line testplan architectures, along with user‑selectable options and automation‑specific subroutines, this application note equips ICT engineers with the knowledge required to safely customize testplans, maximize test coverage, and adapt to increasingly automated, high‑throughput manufacturing lines.