应用文章
参数测量
<p>The latest version (Edition 5) of Keysight Technologies’ popular Parametric Measurement Handbook is now available. Since its initial release in 2010, this handbook has proven itself to be an invaluable reference tool for scientists, engineers and technicians involved with any aspect of parametric test. It is filled with tips to help both novice and advanced users, and the latest edition includes new sections on modular SMUs, high-resistance test, non-volatile memory test, and double pulse testing of power semiconductor devices.</p>
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<p>Key topics covered in this handbook:</p>
<ul>
<li>Parametric measurement basics</li>
<li>SMU fundamentals</li>
<li>On-wafer parametric measurements</li>
<li>Time-dependent and high-speed measurements</li>
<li>Resistance, diode and transistor measurements</li>
<li>Semiconductor capacitance measurement</li>
<li>Power device characterization</li>
</ul>
