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Pinpoint interference with post-processing spectrum management software in the lab.
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Keysight 4291B射频阻抗/材料分析仪是针对表面封装元器件和介电/磁性材料的高精度测量的完整解决方案。与反射测量技术不同，Keysight 4291B使用直接的电流－电压测量技术，可在广泛的阻抗范围内提供更精确的阻抗测量结果。
基本阻抗精度是+/- 0.8%。高Q精度有利于进行低损耗元器件分析。内置合成器扫频范围从1 MHz到1.8 GHz，具有1 MHz的分辨率。1.8米长的精密电缆可将分析仪连接到测试站，以便您将测试点延伸到分析仪之外，而不会影响测量精度。先进的矩阵和错误补偿功能消除了夹具的测量错误，确保DUT/MUT的高精度和可重复性。
Keysight 4291B还提供自动电平精度控制和用IBASIC程序功能监视测试信号；可在恒压或恒流下测量器件。用可选的直流偏置(达40V和100mA)使测量偏置独立于阻抗特性。只要按一个按钮，内装的等效电路分析功能就自动计算5种电路模型的电路常数值。
Keysight 4291B有2个测量通道；每一个通道都可设置为测量1个(即Z)或2个(即Z-theta)阻抗参数。具有分割显示的彩色TFT可显示有效示踪和存储器示踪(保存在RAM中)。内部软盘驱动器以LIF或MS-DOS格式保存程序和测试数据。有了内装IBASIC，您就能从Keysight 4291B直接控制恒温箱或园片探测器这类外部测试设备，而不需要单独的仪器控制器。
材料评估
Keysight 4291B能容易地进行全面的材料评估，提高材料评估的质量和效率。Keysight 4291B提供宽频率范围(1MHz至1GHz)介电/磁性材料测量的总体解决方案。
