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/facets/industry/semiconductor,keysight:hierarchy/industries/semiconductor0,keysight:product-lines/4w,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/rf,keysight:models/w7/w7008esegmentation:campaign/RF,segmentation:campaign/EDA_Software,segmentation:product-category/EDA_Software,keysight:dtx/solutions/facets/design-and-test-product/layout-software,keysight:hierarchy/products/software/pathwave-design-software,segmentation:product-category/EDA_Software/Circuit_Design_Software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:hierarchy/industries/semiconductor0,keysight:product-lines/4w,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/rf,keysight:models/w7/w7008esegmentation:campaign/RF,segmentation:campaign/EDA_Software,segmentation:product-category/EDA_Software,keysight:dtx/solutions/facets/design-and-test-product/layout-software,keysight:hierarchy/products/software/pathwave-design-software,segmentation:product-category/EDA_Software/Circuit_Design_Software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:hierarchy/industries/semiconductor0,keysight:product-lines/4w,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/rf,keysight:models/w7/w7008esegmentation:campaign/RF,segmentation:campaign/EDA_Software,segmentation:product-category/EDA_Software,keysight:dtx/solutions/facets/design-and-test-product/layout-software,keysight:hierarchy/products/software/pathwave-design-software,segmentation:product-category/EDA_Software/Circuit_Design_Software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:hierarchy/industries/semiconductor0,keysight:product-lines/4w,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/rf,keysight:models/w7/w7008esegmentation:campaign/RF,segmentation:campaign/EDA_Software,segmentation:product-category/EDA_Software,keysight:dtx/solutions/facets/design-and-test-product/layout-software,keysight:hierarchy/products/software/pathwave-design-software,segmentation:product-category/EDA_Software/Circuit_Design_Software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:hierarchy/industries/semiconductor0,keysight:product-lines/4w,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/rf,keysight:models/w7/w7008e
如何实现设备模型参数提取与重新居中的自动化
利用机器学习实现设备模型参数提取和模型重新居中的自动化，以探索广泛的参数范围、拟合多个目标，并减少所需的模型仿真次数。
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