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segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776c
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利用可调谐激光器和可编程衰减器,对硅光子器件进行晶圆级光功率扫描自动化测试,以高重复性测量整个晶圆的损耗、响应度和饱和度。
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