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unnel/bofusegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:dtx/solutions/facets/industry/automotive,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:funnel/bofu
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VCSEL器件的LIV测试需要精确控制注入电流并测量光输出功率,以绘制LIV曲线。了解如何使用源/测单元在不同工作条件下对VCSEL器件执行窄脉冲LIV测试。
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