LF Noise Measurement Before and After Stress Biasing with E4727B
应用文章
The E4727B Advanced Low-Frequency Noise Analyzer enables fast, accurate and repeatable Low-Frequency Noise (LFN) measurements on numerous device types with the external probe station control. The E4727B can apply to the realiabilty test for the semicinductor devices, and it is posiible to compare berfore and after the stress biasing test for LFN. Moreover, it aloows the full-auto aging test using temperature control of the prober.