Seamless Low-Frequency Noise Stress Test with A-LFNA

样机

This video demonstrates how A-LFNA can be executed the stress test. The low-frequency noise is one of the indicators of the reliability of the semiconductor devices, and A-LFNA provides the seamless stress test.

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Software

W7501B PathWave WaferPro Measurement and Programming

Run automated wafer-level measurements with turnkey instrument drivers and routines. Create Python 3 and PEL programs to execute custom measurement algorithms.