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No product matches found - System Exception
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Highlights
- One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
- Automated one pass testing for complex and massive optical and electrical measurements
- Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
- High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
- Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
- Dedicated support model enabling high system availability for production
- Keysight-developed Fiber Alignment and Positioning System
- Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
- Reliable performance monitoring by Build-in Automatic System Diagnostics
- Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode
主要技术指标
最大 SPGU 输出通道数
n/a
最大测量引脚数
12 (optical in), 12 (optical out), 30 (electrical)
最小电流测量分辨率
n/a
最小电压测量分辨率
n/a
Parallel Parametric Test Capability
否
最大 SPGU 输出通道数
最大测量引脚数
最小电流测量分辨率
最小电压测量分辨率
Parallel Parametric Test Capability
n/a
12 (optical in), 12 (optical out), 30 (electrical)
n/a
n/a
否
查看更多
其他特性:
One-pass optical & electrical test
外观因素 :
n/a
最大测量引脚数:
12 (optical in), 12 (optical out), 30 (electrical)
最大 SPGU 输出通道数:
n/a
最小电流测量分辨率:
n/a
最小电压测量分辨率:
n/a
Parallel Parametric Test Capability:
否
类型:
Silicon Photonics Wafer Test Solution
Extend the capabilities for your Silicon Photonics Wafer Test System
Featured Resources for the Silicon Photonics Wafer Test System
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