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如何改进CMOS可靠性测试
使用是德科技 B1500A 半导体器件分析仪进行全面的 CMOS 可靠性测试,通过单一集成解决方案评估栅极介电层完整性、热载流子效应、偏压温度不稳定性以及电迁移现象。
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