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WaferPro Express 软件能够对晶体管和电路元件等半导体器件执行自动晶圆级测量，并能提供完整的驱动程序和测试例程，以支持各种仪器和晶圆探头。其全新的用户界面使设置和运行复杂的晶圆级测试方案变得非常简单，同时新的 Python 编程环境能够支持强大的定制功能。

WaferPro Express 是我们与 Cascade Microtech 携手合作的产物，也是晶圆级测量解决方案（WMS）的核心软件。WMS 产品可以极大加快进行首次测量的速度，并能提供精确和可重复的器件和元器件表征。如欲了解更多信息，请参见晶圆级测量解决方案——Cascade Microtech。

WaferPro Express 的主要特性

  • 拥有全套测试算法和仪器驱动程序，可以缩短软件学习时间，加快测量系统的设置过程，让您更快开始首次测量
  • 现代化和直观的用户界面使您可以快速连接仪器，并确定测试计划。为了进一步提高效率，该软件还与 Cascade Microtech Nucleus 和 WinCal XE 软件相集成，以便无缝进行探测台控制和自动射频校准
  • 与 Cascade Microtech 的最新控制软件 Velox 2 进行了独家整合。WaferPro Express 和 Velox 之间的全新 WaferSync 接口能够支持完整的晶圆映射同步功能，并能在测试方案执行期间，自动监测射频校准
  • 当您需要高效处理大量数据时，Data Display、Wafer Mapping Data Viewer 和 SQL 数据库等先进工具可以显著提高生产率。此外，Python/PEL 编程环境使您可以定制测试算法和分析测量数据
  • WaferPro Express 现在是先进低频噪声分析仪（A-LFNA）的正式软件平台。先进低频噪声分析仪是一种为了进行精确且可重复的低频噪声测量而设计的高性能噪声分析仪

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