Avoid DUT Damage by Power Sequencing
应用文章
There are many testing applications in which a device under test (DUT) is powered by multiple DC input voltages and the DUT is sensitive to the order in which those multiple power sources turn off. For example, individual assemblies used in satellites are especially susceptible to damage during uncontrolled multiple power source turn-off events, and these assemblies are very costly. One unexpected cause of power source turn-off occurs when a fault condition such as an over-voltage or over-current condition is detected on one of the sources that causes it to shut down. Having the ability to control the power supply shut-down sequence built into the power supply system itself can greatly reduce the effort and complexity associated with an external shut-down control method.