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N4372E Lightwave Component Analyzer
Opto-electronic S-parameter measurements up to 110 GHz
Industry-First 110 GHz Turn-Key Test System for Optical RX and TX
Based on the N5290A and N5291A 900 Hz to 110/120GHz PNA Millimeter-Wave Systems, the new N4372E Lightwave Component Analyzer offers unprecedented bandwidth for both, optical receiver testing and optical transmitter testing.
Traceable S21 Measurement Across the Entire CWDM Wavelength Window
TX/RX manufacturers are approaching higher baud rates in RZ/NRZ and PAM formats, which pushes the envelope on high-bandwidth S-parameter testing. Up to now, the industry had only access to testing optical transmitters to 110 GHz bandwidth. The new N4372E not only offers opto-electronic tests up to 110 GHz in an extended wavelength range down to 1260 nm but addresses also RX test up to 110 GHz in the full 1260 nm to 1620 nm range, thanks to a transmitter that is calibrated traceable to NIST.
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