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B2900B/BL series Graphical SMU solves precision measurement challenges and improve test efficiency from lab to manufacturing for a wide range of applications at the best-in-class cost performance
Broad application by a single instrument
• Wide application coverage by integrated 4-quadrant source / measure capabilities up to 210 V, 3 A DC/10.5 A pulsed
• Flexible output waveform by pulse, sweep and list sweep function
Capturing true characteristics with superior high speed digitizing and high resolution
• High sourcing and measurement resolution: 10 fA/100 nV
• Fast setting/digitizing interval 10 μs/100 kpts/s
Test time reduction
• Fastest sweep measurement available in a benchtop SMU
• Reducing execution time of repeated test commands by programming memory
Test efficiency improvement
• Innovative GUI: I-V (current - voltage) measurement without PC programming
• Multiple software control options, allowing you to choose the solution that best fits your particular application
Typical applications
• Optical devices (laser diodes, photo diodes)
• Organic devices (OLEDs)
• Photovoltaic (solar) cells
• Nano-technology materials
• Power management devices (LDOs)
• Semiconductor devices (FETs, transistors)
• Resistors, diodes, varistors, and other component devices
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