Pulsed IV/RF Measurements
解决方案概述
Accelerate your design process with pulsed measurements of IV characteristics and RF parameters
Pulsed measurements are the preferred method of capturing current-voltage characteristics (IV characteristics) of active devices such as field effect transistors (FETs) and bipolar junction transistors (BJTs). With the growing popularity of highpower devices like GaN HEMTs and LDMOS devices, the measurement of these characteristics is becoming ever more challenging.
To meet these challenges, Focus Microwave has developed the AU5, its latest generation pulsed IV/RF characterization system. With a modular hardware design and open software architecture the AU5 is designed to meet the needs of the device modeling community.