应用文章
Turnkey Solution for LF Noise Measurement
Keysight E4727B (Advanced Low-Frequency Noise Analyzer; A-LFNA) allows you to measure the LF (Low Frequency) noise of semiconductor devices very easily. The measurable device of E4727B is not only a semiconductor device (FET, BJT, etc.) but circuit (OpAMP. LDO, DAC, etc.) measurement is also available. The E4727B consists of hardware and software. The user can measure LF noise by just enter the expected measurement conditions and then the software will set all parameters of custom hardware optimally. The circuit measurement is very easy, and the customer only needs to prepare evaluation PCB and external instruments such as DC power supply and digital signal source. This Application Note shows an example of LF noise measurement of DAC (D/A Converter) with E4727B, and AD5601 is selected for DAC. The AD5601 is fabricated by Analog Devices, Inc. and is an 8-bit DAC operated from a single 2.7 V to 5.5 V supply.
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