Best Practices for IV Characterization
应用文章
The current versus voltage (IV) measurement is essential to test semiconductors, optical devices, active/passive components, and general electronic devices. It is a fundamental tool for understanding, characterizing, and ensuring the proper functioning of electronic devices across various categories. They provide insights into how these devices behave under different operating conditions and are essential for design, quality control, troubleshooting, and reliability assessment. Measuring current versus voltage (IV) can be a complex task without the appropriate tools. There are multiple instruments available to facilitate these measurements. Among the options is the Source Measure Units (SMUs).
A Source Measure Unit (SMU) can source voltage or current with high precision while simultaneously measuring both current and voltage. This versatility makes them ideal for research and development (R&D) device IV characterization and manufacturing test applications.