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Determined the Low-Frequency Noise Source in Cryogenic Operation

Determined the Low-Frequency Noise Source in Cryogenic Operation

Case Studies

Japan's National Institute of Advanced Industrial Science and Technology (AIST) successfully the measurements of random telegraph noise (RTN) in short-channel MOSFETs at cryogenic temperatures using the Keysight E4727B Advanced Low-Frequency Noise Analyzer is expanding the understanding of noise sources in quantum computing, paving the way for faster machines moving forward.

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