Test-System Development Guide: Computer I/O Considerations
应用文章
This application note is part of the Test-System Development Guide series, which is designed to help you quickly design a test system that produces reliable results, meets your throughput requirements, and does so within your budget.
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing.
This application note, Computer I/O Considerations, is the second in the series. It describes the advantages of using computer-industry standard I/O and explores the advantages and disadvantages of GPIB, USB and LAN interfaces for rack-and-stack test systems.