Medalist iVTEP—Intelligent Vectorless Test EP
技术概述
iVTEP can help manufacturers overcome in-circuit test challenges brought on by higher BGA density and decreased pitch.
Leading Innovation in Vectorless Test Solution
The Keysight Technologies, Inc. Medalist iVTEP is an extended version of the patented Keysight VTEP technology that builds on the legacy of Keysight TestJet. This latest innovative solution will address the in-circuit test challenges brought on by device packages that are pushing today’s manufacturers to the limit. With minimal dependency on lead frame geometries, iVTEP yields more reliable and stable measurements to help manufacturers cope with today’s challenging device packages. This new capability is available on all Keysight Medalist i3070 In-Circuit Test (ICT) platforms.
Here are the key highlights of iVTEP:
- New technology is less dependent on lead frame geometries
- Extremely stable vectorless measurements of signal pins on ultra small geometry packages, flip chips, as well as devices with minimal or no lead frames and devices under heat spreaders
- Improved pin coverage – dramatic improvements over existing vectorless test techniques, including Keysight TestJet and VTEP
- Automatic debug software – sets limits, saves hours of test development time
- New software enhancement uses existing VTEP hardware and use model – minimizes risk, no new hardware needed
Enhanced capabilities of iVTEP
The rapid evolution of Surface Mount Technology has dramatically impacted testing of printed circuit board assemblies. It is now physically possible to increase board population density with ultra small geometry packages, denser micro BGAs and flipchips with decreased pitch, while addressing heat challenges with these new component packages.
Keysight Medalist iVTEP extends the proven benefits of the patented Keysight VTEP technology. A key advantage is that its effectiveness is not limited by lead frame geometries or devices with heat spreaders. Hence, with introduction of iVTEP technology, for the first time, SMT manufacturers can have the ability to quickly identify solder open defects with vectorless techniques and not worry that the device package will affect the measurement quality.
Summary and conclusion
Keysight Medalist intelligent Vector-less Test Extended Performance (iVTEP) brings matchless accuracy unsurpassed test stability, repeatability and transportability. iVTEP is less dependent on lead frame geometries and devices with heat spreaders. Keysight Medalist iVTEP is the ultimate choice for SMT manufacturers who want early, pin-point accurate diagnosis of open solder joints, independent of packaging technologies.