X-Series Signal Analyzers (MXA/EXA) Single Acquisition Combined WLAN Measurement Application (N9077A-XFP)

• Supports IEEE standard 802.11a/b/g
• SCPI1-based measurement application allows production familiar remote programming commands for ease-of-test software development
• Flexible selections of predeined parameters allow easy and customizable set-up of the measurements to suit various production test requirements
• Varied measurement methods to meet different needs for best speed or best accuracy
• Supports frequency hopping for broadband and multi-frequency points measurements
• Tabular user interface showing the parameter, measurement, and result lists for easy viewing
• Parameter list view displays SCPI commands, related parameter name and value in one table and is easier to understand than only showing a list of SCPI commands
• Additional RF envelope view provides troubleshooting tool for the time alignment between target signal and the instrument

Driven by the increasing need for complex multiple tests for multiple formats (2G/3G) and the manufacturing pressure for lowering cost by reducing test time, single acquisition combined measurement is a measurement processing technique that addresses these challenges. When testing WLAN devices, such as standalone laptop PC cards or WLAN chipsets, the N9077AXFP allows manufacturers to make measurements much faster than traditional measurements. In the combined measurement applications a single acquisition of data is used for multiple measurements, saving valuable time in comparison to traditional measurements that recapture data for each individual measurement. The N9077A-XFP option is designed for time-critical tests on the production line, and the high dynamic range of the Keysight Technologies, Inc. signal analyzers ensures that the measurements remain as accurate as possible.

Advantages of the combined WLAN application measurements 

Acceleration of test speed without required measurement switching and using fewer acquisitions Compared with traditional one-button measurements, which limit the “speed” of tests due to measurement switching time (such as from SEM to EVM), the combined WLAN measurement application uses SCPI-based programming to configure the X-Series signal analyzer to conduct the specified measurements ahead of time, without measurement switching, and with fewer acquisitions that normally would require processing of the data after each capture is completed. 

Available measurements: 

• Transmit Power 
• Transmit Output Spectrum 
• Modulation Accuracy 

Measurement overview 

The N9077A–XFP combined WLAN measurement application is ideal for characterizing the overall PHY layer performance of a WLAN transmitter. Take advantage of standardized tests to evaluate a transmitter against the IEEE standards for manufacturing test. The N9077A–XFP combined WLAN measurement application provides all of the IEEE 802.11 a/b/g WLAN transmitter tests. Through SCPI commands, turn Transmit Output Spectrum measurement and Modulation Accuracy measurement On or Off to assure complete assessment or perform only a few tests to reduce overall test time and speed device evaluation. The Transmit Power measurement specifies the total power of the transmitted signal, and the power spectral density is also provided.  

Greater flexibility of measurement setup 

The N9077A-XFP measurement application option provides high flexibility for the setup of combined measurement parameters. Figure 5 shows an example of a parameter list view. Parameter name, with its SCPI command and value, is listed in this view. The list is ordered in SCPI commands and identifying what parameters correspond to specific commands can be easily found. The value can be verified or modified in three ways—sending SCPI commands, using the menu and front panel keys, or using a mouse and keyboard. This is more convenient than having to access the SCPI programming interface for minor changes.  

Simplified user interface for reduced processing overhead allows for highest speed 

The user interface of the N9077A-XFP measurement application option is designed for maximum efficiency. All of the results listed in the Result List view can be queried by SCPI commands. (See Figures 2, 3, and 4) 

Comprehensive user interface for troubleshooting

 For troubleshooting or diagnostic purposes, the N9077A-XFP measurement application option provides a graphical user interface that displays measurement traces. The RF Envelope view is useful for setting time alignment between target signal and the instrument. Figure 6 shows a view of an RF envelope. In this view, the instrument acquires a trace with three bursts for demodulation. The RF Envelope view can be turned off during the measurement for higher speed.