Swept-wavelength Measurement of IL and PDL
应用文章
Introduction
The spectral measurement of optical insertion loss (IL) and polarization dependent loss (PDL) as well as the related parameter for relected light, return loss (RL), provides the primary performance data for verifying passive iberoptic components including couplers and splitters. The spectral dependence of these parameters is especially important for testing components designed to route signals based on their wavelength, such as wavelength multiplexers, demultiplexers and add/drop ilters used in dense wavelength division multiplexed (DWDM) networks, coarse WDM (CWDM) networks and passive optical networks (PON) used for iber-to-the-home installations. The demands on such tests have increased for conigurable and dynamic network components for which the spectra can be adjusted and may need calibration, such as wavelength selective switches and other forms of reconigurable optical add/drop multiplexers (ROADM) as well as dynamic gain equalizers and other components using variable attenuation.