Accurate and Efficient Frequency Evaluation of a Ring Oscillator
应用文章
With the continued demand for higher-speed operation of semiconductor devices, the measurement of gate delay and interconnect delay has become more important than ever. These two parameters play key roles in determining the ultimate speed of device operation. High speed operation has always been critical for successful logic devices. With new market pressures on peripheral devices, the need for high speed operation is now becoming necessary for memory devices.
It is commonly known that gate delay time can be evaluated by measuring the oscillation frequency of a ring oscillator test structure.