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应用文章
Manufacturers of optical transceivers are faced with increasing challenges to their businesses, particularly how to reduce product costs. Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do. Traditional methods of eliminating tests or trying to make tests run faster may not be feasible, may not yield the intended benefit or may provide results that don’t agree well with their customer’s measurements. The use of parallel testing has enabled some improvements, but challenges in capturing and organizing measurement results for multiple channels have precluded the fully desired improvements.
Keysight Technologies, Inc. continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals. This application note describes several techniques that Keysight has created and improved to remotely program the DCA mainframes, to choose the appropriate tests, and to objectively determine just how much testing is required. Improvements in test station throughput of 2X to 17X can be achieved by applying these techniques, resulting in a cost of test of a few cents per transmitter.
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