STAr Sagi-MDR: Multi-Die Reliability (MDR) Test Solution
应用文章
Wide varying requirements for different applications of integrated circuits have resulted in increasing number of fabrication processes for semiconductor fabs. The advancement of technologies which led to the increase in manufacturing complexities has increased the needs for high reliability resolution to accurately predict the lifetime of the devices. These have resulted in increasing needs for process device reliability qualification, coupled with the advanced nanometer technology nodes there are increasing demands for advanced reliability testers. Reliability qualification, especially for MOSFET HCI, BTI, GOI/TDDB, together with EM have becoming one of the critical areas of challenges in research and development through to production.