World Leading High-Accurate Dk/Df Measurement System for Thin Film, 20 GHz - 300 GHz
解决方案概述
Supports specimens as thin as 5µm in wide frequency range of 20 GHz~300 GHz
JIS Standard
KEYCOM’s Fabry-Perot εr and tanδ measurement system of open resonator method, which attains measurement accuracy as 0.0001 level of tanδ. Because of high accuracy, it is possible to measure ultra-thin sheet and specimens of low tanδ materials such as PTFE.
This measurement system is popular among many manufacturers not only for the purpose of reliable reports for submission as it is JIS standardized, but also for the purpose of R&D as it can check very slight difference of characteristics.
Standardization
JIS R 1660-2 (Japanese Industrial Standards)
- Fully compatible with JIS R1660-2-2004 specification by using the software for sheet. And for ultra thin sheet, it is complied with “Millimeter wave measurement of complex permittivity by perturbation method using open resonator” IEEE Trans. Instrument and Measurement VOL.57. No.12, Dec.2008 pp2868-2873"