Conventional ADC testing solution can be complex and expensive
The servo-loop based ADC testing method (Figure 1) is widely used to evaluate an ADC’s differential & integral non-linearity (DNL/INL). However, this technique has several issues:
- Issue 1: This test method requires many different components, such as a voltage/current source, a digital multimeter (DVM), servo circuitry, etc. It also requires a complicated program to control and synchronize everything.
- Issue 2: Conventional voltage/current sources used in the servo-loop test require significant averaging to eliminate noise as well as frequent PC communication, creating lots of test over head time.
- Issue 3: The histogram testing method is the most desirable technique due to its simplicity and efficiency; however, most conventional instrumentation does not have the required resolution, noise floor and linearity to test high bit ADCs.