Protect Against Power-Related DUT Damage During Test
应用文章
If you want to meet your delivery and budget goals, it is important to protect your devices against damage during testing. When the possibility of damaging your device is a concern, make sure your test plan includes strategy and equipment that reduce risk. Using tools with built-in protection, like over-voltage and over-current protection, is crucial for device safety. This application note will look at proven methods for automatically protecting your device from damage.
Problem
Controlling power supply output voltage and current to avoid over stressing the DUT under fault or near-fault conditions requires a rapid and effective response to a variety of situations. The primary causes of DUT failure are over-voltage and over-current events, some of which are very short duration while others endure until they are discovered.