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Thin ilm coatings are extensively used in various applications, such as microelectronics, data-storage media, surgical tools, biomedical prosthetic components, machining tools, turbine blades etc. Along with some functional improvements, these thin coatings also signiicantly enhance the mechanical reliability of the components. Hard thin ilms provide the resistance to mechanical deformation that the components need during their application. With the advancements in nanomaterials research, new thin ilm systems — often only a few 100’s of nm — are being developed to improve the performance of thin coatings in all of these technologically important areas. Hence, it is becoming more and more important to design new test methods that addresses the relevant deformation mechanisms in thin ilms, which are not suited to be characterized by the conventional test methods and standards.
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